Sigma Instruments thin film controllers, TFM, thin film real-time monitoring and control, quartz crystal monitor, codeposition control and deposition rate control

Sigma Instruments SQS-242 Real Time Thin Film Thickness Deposition Monitor / Control Software.

The SQS-242 thin film thickness process control software, is integrated with the SQM-242 PCI BUS card 8 quartz crystal sensors can be monitored and 4 sources controlled. With the addition of a PLC interface, the user can control and customise complicated processes, enabling manual systems to be automated for at a fraction of the cost of conventional system control packages.

Thin film monitoring and control systems
SQS242 thin film process control software
Seamless integration with SQM242 PCI card straight out of the box! Familiar point and click Windows® interface Single screen process development - no buried, multi-level menus Unlimited processes, films, materials stored in Microsoft Access® database Measures up to eight sensors, controls up to four sources Up to four channel deposition
Process, Films, Materials Unlimited #, 12 Character Alpha Numeric names, stored in Microsoft Access database Layers, Rate Ramps Unlimited #, stored in Microsoft Access database Process Setup Windows Cut/Copy/Paste.  All parameters available from a single screen Pre Conditioning 2 Ramp/Soak power cycles per film.  User sets ramp time, soak time, and soak power Shutter Delay User sets on/off, required accuracy, and delay timeout Deposition Unlimited number of rate ramps Set PID control terms. Switch to/from manual power during deposition Set required control accuracy and error action (ignore, stop, or hold power) Set rate sampling mode (continuous, time based, accuracy based) Post Conditioning 1 Feed and Idle cycle per film

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