Sigma Instruments thin film controllers, TFM, thin film real-time monitoring and control, quartz crystal monitor, codeposition control and deposition rate control

Sigma Instruments SQM-160 Real Time Multi-Head Quartz Crystal Film Thickness Monitor.

Our SQM-160 thin film thickness monitor, is a very low cost easy to use film thickness monitor, and is easily integrated into any system. With 2 quartz crystal sensor inputs as standard, but the option of 6 inputs if required, it can open and close the source shutter to give very accurate thin film deposition control.

Thin film monitoring and control systems
SQM-160 Thin Film Deposition Monitor
Low cost Easy to use multi-film capability relay outputs for event control 2 QCM capability PC data connection
Features Two to six quartz crystal measurement channels Averages multiple sensors for improved accuracy Displays Rate/Thickness or Frequency Adjustable reading rate, resolution, and filter Data collection and graphing software included
Sensor Inputs 2 (standard) to 6 (optional) Thickness Resolution 1 Å Frequency Range 4.0MHZ to 6.0MHZ Rate Resolution 0.1 Å/s or 0.01Å/s Measurement Period .15-2.0 sec. Frequency Resolution 0.1 Hz Frequency Accuracy .01% at 2 reading/second Rate Accuracy .5% typical Relays Shutter Thickness Set point Time Set point Crystal Fail Inputs Open Shutter Close Shutter Zero Thickness Zero Time Dimensions 88.5mm  x  212.7mm  x  196.9mm Power 90-140VAC, 180-240VAC, 50-60HZ
Typical configuration for a full system: SQM160, Sensor kit (BNC cable set, oscillator, crystals, head to feed through cable), Feed through, quartz crystal head.

Disclaimer: The E306.CO.UK website is a totally independent site and is in no way affiliated with or connected to the BOC Edwards company who are the original manufacturers of the 306 thin film deposition system.