Sigma Instruments SID-242 Real Time Multi-Head Quartz Crystal Thin Film Thickness Co Deposition Controller.

Our SID-242 thin film thickness controller, controls deposition rate and thickness in multi-layer thin film processes. It is a low-cost solution for more reliable and accurate deposition than is possible with manual control. With up to 8 quartz crystal sensor inputs and multiple relay outputs it is capable of controlling 4 sources simultaneously for accurate co deposition processes.

Thin film monitoring and control systems

SID242 Co-Deposition Controller

Uses up to 8 quartz sensors to control the deposition rate and thickness of up to 4 materials simultaneously
Unlimited processes, films, materials in Microsoft Access® database
Familiar Windows® user interface with color LCD display
Single-screen process setup
Flexible I/O
SQM-242 card and SQS-242 software available separately

Sensor Inputs (4to 8)	Standard quartz crystal oscillator	Source Outputs (2 to 4)	0 to ±10V
Frequency Range	1.0MHZ to10MHZ	Output Resolution	15 bits
Measurement Period	.15-2.0 sec.	Control Loop Type	PID
Predefined Relays	Source Shutters: 1, 2 Sensor Shutters: 1,2,3,4 All Sensors Good All Sensors Bad Process Running Deposit Mode Not Deposit Mode	Predefined Inputs	Start Process Stop Process Start Film Stop Film Zero Thickness Force Final Thickness
Computer (subject to change)	233MHZ Pentium, 32MB RAM 4.2GB HD, 1.44MB FD 2 serial, 1 parallel ports	User Interface	Active Matrix VGA Color LCD 6 Soft Keys, Knob,Touchpad Windows 98
Dimensions	5¼" H x 16½" W x 15" D	Power	120/240VAC, 47-63HZ

Disclaimer: The E306.CO.UK website is a totally independent site and is in no way affiliated with or connected to the BOC Edwards company who are the original manufacturers of the 306 thin film deposition system.